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, February–June 2008, Pages 487–491Proceedings of the 15th Solid State Dosimetry (SSD15)Edited By A.J.J. Bos
TL dosimetry of natural quartz sensitized by heat-treatment and high dose irradiation, , , , , , a Department of Nuclear Energy, Federal University of Pernambuco,
CDU Recife, PE, Brazilb Department of Mining Engineering, Federal University of Pernambuco,
CDU Recife, PE, Brazilc Institute of Physics, University of S&o Paulo,
Cidade Universit&ria, S&o Paulo, SP, BrazilThe aim of this paper is to report the sensitization of the TL peak appearing at 270 &C in the glow curve of natural quartz by using the combined effect of heat-treatments and irradiation with high γγ doses. For this, thirty discs with 6&1mm2 were prepared from plates parallell to a rhombohedral crystal face. The specimens were separated into four lots according to its TL read out between 160 and 320 &C. One lot was submitted to γγ doses of 60Co radiation starting at 2 kGy and going up until a cumulative dose of 25 kGy. The other three lots were initially heat-treated at 500, 800 and 1000 &C and then irradiated with a single dose of 25 kGy. The TL response of each lot was determined as a function of test-doses ranging from 0.1 to 30 mGy. As a result, it was observed that heat-treatments themselves did not produce the strong peak at 270 &C that was observed after the administration of high γγ doses. This peak is associated with the optical absorption band appearing at 470 nm which is due to the formation of [AlO4]& acting as electron&hole recombination centers. The formation of the 270 &C peak was preliminary analyzed in relation to aluminum- and oxygen-vacancy-related centers found in crystalline quartz.KeywordsQuartz single crystal; Thermoluminescence; γγ-rays; Pre-dose; Heat-treatment; Al-hole center
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, September–December 2002, Pages 291–298Crystal Chemistry of Functional Materials II, Proceedings of Symposium L, E-MRS Spring Meeting, June 18-21, 2002
Structural characterization of sol-gel lanthanum cobaltite thin films, , , , , , , , a INSTM and Laboratorio di Strutturistica Chimica, Dipartimento di Ingegneria Meccanica, Universit& di Brescia, Via Branze, 38, 25123 Brescia, Italyb INSTM and CNR-ISTM, Dipartimento Chimica Inorganica, Metallorganica e Analitica, Universit& di Padova, Via Marzolo 1, I-35131 Padova, Italyc INSTM and Dipartimento Chimica Inorganica, Metallorganica e Analitica, Universit& di Padova, Via Loredan 4, I-35131 Padova, ItalyThe present paper is focused on structural, microstructural and compositional studies on nanophasic LaCoO3 thin films obtained by the sol-gel route. The sample structure and microstructure were investigated by Glancing Incidence X-Ray Diffraction (GIXRD) and X-Ray microdiffraction (MicroXRD), whereas the surface and in-depth chemical composition was studied by X-Ray Photoelectron Spectroscopy (XPS). All the films are structurally homogeneous and not textured. A cubic-to-rhomboedral phase transition was detected after the thermal treatment at 800 &C. Evidence of residual stress was found by GIXRD patterns collected at different incidence angles. After thermal annealing at 1000 &C, only the crystalline La2O3 phase was detected.KeywordsSol-gel; LaCoO3; Thin films; XPS; GIXRD; X-Ray microdiffraction
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